GALS-SA Test Extension

Abstract

The paper presents a flexible and scalable test solution designed for a new class of hybrid circuits - GALS-SA that combines the structured ASIC advantages with the GALS (Globally Asynchronous Locally Synchronous) architecture. The test solution consists of two parts: intrinsic tests that ensure important functions are always tested at power-up and extension tests that are required only during prototype debugging and characterization and are implemented on configurable logic that can be used later for user design for mass production. The proposed solution offers a means to implement any user-specific test function without affecting the platform's intrinsic architecture with a small area penalty.