ITO and FTO Coated Glass Characterization Using SEM and AFM Techniques

Authors

  • L. Olteanu Valahia University of Targoviste, Romania
  • R.M. Ion Valahia University of Targovitse; National Institute of Research and Development for Chemistry and Petrochemistry - ICECHIM, Bucharest, Romania
  • I.A. Bucurica Valahia University of Targoviste, Romania
  • I.V. Gurgu Valahia University of Targoviste, Romania
  • I.D. Dulama Valahia University of Targoviste, Romania
  • S. Teodorescu Valahia University of Targoviste, Romania

DOI:

https://doi.org/10.31926/but.ens.2019.12.61.1.15

Keywords:

ITO, FTO, SEM, AFM, roughness

Abstract

Transparent conducting oxides like indium tin oxide (ITO) and fluorine doped tin oxide (FTO) represent an active area of research in the field of nanomaterials. This study aims to investigate the surface profile of the ITO and FTO coated glass used for dye-sensitized solar cells (DSSCs) manufacturing process. The surface morphology of the samples was probed by scanning electron microscopy (SEM). The atomic force microscopy (AFM) technique was used in order to obtain the topography and roughness for these samples.

Author Biographies

L. Olteanu, Valahia University of Targoviste, Romania

Doctoral School of Materials Engineering

R.M. Ion, Valahia University of Targovitse; National Institute of Research and Development for Chemistry and Petrochemistry - ICECHIM, Bucharest, Romania

Doctoral School of Materials Engineering;
”Conservation and Evaluation of Cultural Haritage” Research Group

I.A. Bucurica , Valahia University of Targoviste, Romania

Institute of Multidisciplinary Research for Science and Technology

I.V. Gurgu, Valahia University of Targoviste, Romania

Institute of Multidisciplinary Research for Science and Technology

I.D. Dulama, Valahia University of Targoviste, Romania

Institute of Multidisciplinary Research for Science and Technology

S. Teodorescu, Valahia University of Targoviste, Romania

Institute of Multidisciplinary Research for Science and Technology

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Published

2020-02-11

Issue

Section

MATERIALS SCIENCE AND ENGINEERING