A Critical Analysis of Schelkunoff’s Formalism in EMC

Authors

  • P. Ogrutan Transilvania University of Brasov, Romania
  • L.E. Aciu Transilvania University of Brasov, Romania
  • A. Mailat Transilvania University of Brasov, Romania

Keywords:

electromagnetic compatibility, Schelkunoff model, shielding effectiveness, limits

Abstract

The widespread success of Schelkunoff’s formalism from electromagnetic compatibility, also known in literature as the transmission line model or the method of the impedance is due to the physical and mathematical isomorphism from which it originates that exists between the equations describing the behavior of an infinite plane screen in free space characterized by the macroscopic material parameters _, μ, _ and the equations of the coaxial transmission line. The Schelkunoff model has some limitations, the arguments with respect to these being presented in this paper.

Author Biographies

P. Ogrutan, Transilvania University of Brasov, Romania

Dept. of Electrical Engineering and Computer Science

L.E. Aciu, Transilvania University of Brasov, Romania

Dept. of Electrical Engineering and Computer Science

A. Mailat, Transilvania University of Brasov, Romania

Dept. of Electrical Engineering and Computer Science

Published

2007-05-23

Issue

Section

ELECTRICAL ENGINEERING, ELECTRONICS AND AUTOMATICS